发明名称 Semiconductor device and manufacturing method thereof
摘要 In a crystallization process of an amorphous semiconductor film, a first crystalline semiconductor film having crystalline regions, and dotted with amorphous regions within the crystalline regions, is obtained by performing heat treatment processing after introducing a metallic element which promotes crystallization on the amorphous semiconductor film. The amorphous regions are kept within a predetermined range by regulating the heat treatment conditions at this point. Laser annealing is performed on the first crystalline semiconductor film, to form a second crystalline semiconductor film. Electrical characteristics for a TFT manufactured based on the second crystalline semiconductor film can be obtained having less dispersion.
申请公布号 US2001021544(A1) 申请公布日期 2001.09.13
申请号 US20010799373 申请日期 2001.03.05
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 OHNUMA HIDETO;KOKUBO CHIHO;TANAKA KOICHIRO;MAKITA NAOKI;TSUCHIMOTO SHUHEI
分类号 H01L21/20;H01L21/77;H01L21/84;H01L27/12;H01L29/04;(IPC1-7):H01L29/76;H01L31/062;H01L23/62;H01L21/00;H01L29/74;H01L31/111;H01L29/94;H01L31/113;H01L31/119 主分类号 H01L21/20
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