发明名称 Single semiconductor wafer processor
摘要 In a method of processing or drying a semiconductor wafer, the wafer is withdrawn from a fluid bath at an inclined angle, and at a selected withdrawal speed. A solvent vapor is provided at the surface of the bath, to create a surface tension gradient and promote drying, or removal of the fluid from the wafer surface. After the wafer is entirely withdrawn from the rinsing liquid, the wafer is rotated briefly, to remove any remaining fluid via centrifugal force, without the fluid drying on the wafer. The wafer is held onto a rotor assembly which rotates the wafer within an enclosed chamber, and which is also pivoted within the chamber, to position the wafer at the incline angle.
申请公布号 US2001020482(A1) 申请公布日期 2001.09.13
申请号 US20010859930 申请日期 2001.05.17
申请人 SEMITOOL, INC. 发明人 SCRANTON DANA;CURTIS GARY L.
分类号 H01L21/304;H01L21/00;(IPC1-7):B08B3/04 主分类号 H01L21/304
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