发明名称 |
ANTISTATISCHES MIKROSKOP |
摘要 |
Microscopes having plastic components such as knobs, covers and eyepiece rings are rendered antistatic by using static charge dissipating plastic materials instead of conventional plastics. Such antistatic microscopes are especially useful in the manufacture and inspection of semi-conductors which are easily damaged by exposure to static charges. |
申请公布号 |
DE69427376(T2) |
申请公布日期 |
2001.09.13 |
申请号 |
DE1994627376T |
申请日期 |
1994.12.05 |
申请人 |
LEICA INC., DEPEW |
发明人 |
MEIER, A.;VACCARELLI, VINCENT |
分类号 |
G02B21/24;C09K3/16;G02B21/00;H05F3/00;(IPC1-7):G02B21/00;G02B21/26;G02B7/00 |
主分类号 |
G02B21/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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