发明名称 ANTISTATISCHES MIKROSKOP
摘要 Microscopes having plastic components such as knobs, covers and eyepiece rings are rendered antistatic by using static charge dissipating plastic materials instead of conventional plastics. Such antistatic microscopes are especially useful in the manufacture and inspection of semi-conductors which are easily damaged by exposure to static charges.
申请公布号 DE69427376(T2) 申请公布日期 2001.09.13
申请号 DE1994627376T 申请日期 1994.12.05
申请人 LEICA INC., DEPEW 发明人 MEIER, A.;VACCARELLI, VINCENT
分类号 G02B21/24;C09K3/16;G02B21/00;H05F3/00;(IPC1-7):G02B21/00;G02B21/26;G02B7/00 主分类号 G02B21/24
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