发明名称 Simultaneous formation of poly-poly capacitor, MOS transistor and bipolar transistor on substrate used in production of integrated circuits comprises using polycrystalline silicon to form electrodes
摘要 The simultaneous formation of a poly-poly capacitor, a MOS transistor and a bipolar transistor on a substrate (10) comprises applying and structuring a first layer made from polycrystalline silicon on the substrate to form a first plate electrode of the capacitor and an electrode of the MOS transistor; and applying and structuring a second layer made from a polycrystalline silicon on the substrate to form a second plate electrode of the capacitor and an electrode of the bipolar transistor. The second polycrystalline layer is made from SiGe-polycrystalline silicon. An Independent claim is also included for the production of a poly-poly capacitor. Preferred Features: The electrode of the MOS transistor comprises a polycrystalline gate (20) formed on a gate oxide (22). The gate oxide is formed on the surface of the substrate and the substrate has source and drain regions (14) below the polycrystalline gate.
申请公布号 DE10107012(A1) 申请公布日期 2001.09.13
申请号 DE2001107012 申请日期 2001.02.15
申请人 INTERNATIONAL BUSINESS MACHINES CORP., ARMONK 发明人 COOLBAUGH, DOUGLAS DUANE;FREEMANN, GREGORY GOWER;SUBANNA, SESHADRI
分类号 H01L21/331;H01L21/02;H01L21/822;H01L21/8234;H01L21/8249;H01L27/04;H01L27/06;H01L29/73;H01L29/737;(IPC1-7):H01L21/822;H01L27/08 主分类号 H01L21/331
代理机构 代理人
主权项
地址