发明名称 Method of evaluating quality of crystal unit
摘要 A method of evaluating quality of a crystal unit, capable of performing quantitative measurement of an actual operation of a crystal unit which is to be oscillated in an actual oscillator to ensure an accurate quality evaluation, is provided which comprises the steps of increasing a DC input voltage of a crystal oscillator, said crystal oscillator having at least one AGC amplifier whose amplification rate varies depending on the DC input voltage and having a crystal unit connected thereto; measuring a maximum value of the DC input voltage at a start of oscillation of the crystal oscillator; and evaluating quality of the crystal unit by the measured maximum value.
申请公布号 US2001020874(A1) 申请公布日期 2001.09.13
申请号 US20010764456 申请日期 2001.01.19
申请人 USHIYAMA HAJIME 发明人 USHIYAMA HAJIME
分类号 G01R29/22;G01R31/00;G01R31/28;H03B5/32;H03H3/02;(IPC1-7):G01R29/22 主分类号 G01R29/22
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