发明名称 Phase mask
摘要 The phase mask is provided for illuminating a photo-sensitive layer in a photolithography process for producing integrated circuits with a predetermined pattern of optically transmissive regions. The phase mask is configured, in zones in which the distances between neighboring regions in at least one geometrical direction are less than a predetermined limiting distance, in each case as an alternating phase mask. The zones with isolated contact windows are in each case configured as a halftone phase mask or a chromeless phase mask.
申请公布号 US2001021476(A1) 申请公布日期 2001.09.13
申请号 US20010761810 申请日期 2001.01.16
申请人 GANS FRITZ;GRIESINGER UWE;PFORR RAINER 发明人 GANS FRITZ;GRIESINGER UWE;PFORR RAINER
分类号 G03F1/00;(IPC1-7):G03B27/42;G03F9/00;G21K5/10;H01J37/08 主分类号 G03F1/00
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