发明名称 Semiconductor memory device with column gate and equalizer circuitry
摘要 A semiconductor memory device includes a semiconductor substrate and a plurality of element regions formed in the semiconductor, wherein at least one column gate and at least one equalizer are formed as a set in one element region of the plurality of element regions. In one embodiment, a set of a column gate and an equalizer share a diffusion layer with an adjacent set of a column gate and an equalizer. In a second embodiment, a gate electrode of the equalizer is disposed to divide a diffusion layer into six regions. In other embodiments, the equalizer is surrounded by at least a gate electrode of a column gate. In yet other embodiments, the sets of column gates and equalizers are disposed parallel to a bit line.
申请公布号 US6288927(B1) 申请公布日期 2001.09.11
申请号 US20000587263 申请日期 2000.06.05
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 INABA TSUNEO;SHIRATAKE SHINICHIRO;TSUCHIDA KOUJI
分类号 G11C11/401;G11C7/10;G11C7/12;G11C7/18;H01L21/8242;H01L27/108;(IPC1-7):G11C5/06 主分类号 G11C11/401
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