发明名称 CHARGED-PARTICLE BEAM IRRADIATION DEVICE AND X-RAY IRRADIATION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charged-particle beam irradiation device and an X-ray irradiation device capable of preventing generation of ozone caused by charged- particle beam irradiation or X-ray irradiation. SOLUTION: In this charged-particle beam irradiation device, a gas container in which gas including no oxygen is filled is installed on an irradiation route of a charged-particle beam, and the charged-particle beam irradiated from a charged-particle beam irradiation part is irradiated onto an object to be irradiated through the gas container. In this X-ray irradiation device, a similar gas container is also installed.
申请公布号 JP2001242298(A) 申请公布日期 2001.09.07
申请号 JP20000053592 申请日期 2000.02.29
申请人 MITSUBISHI ELECTRIC CORP 发明人 GAMA ETSUKO
分类号 G21K5/00;A61L2/08;B01J19/08;B01J19/12;G21K5/02;G21K5/04 主分类号 G21K5/00
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