发明名称 METHOD OF EXPOSURE AND ALIGNER, MASK, AND METHOD OF MANUFACTURING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a method of exposure and aligner for exposure by which exposure can be performed efficiently in a short time, and at the same time, the cost of exposure can be reduced, a mask, and a method of manufacturing device. SOLUTION: An aligner E synchronously moves a mask M and a substrate P from an accelerating section H 1 to a decelerating section H 4 through a setting section H 2 and a normal section H 3, and during the movement, transfers the image of a pattern formed on the mask M to the substrate P. When a transfer starting point T is set in the setting section H 2 according to the target accuracy of the pattern to be formed, the exposure can be performed efficiently, in such a way that the exposing area on the substrate P can be expanded, and so on, in the case where the mask M and substrate P are moved by prescribe number of strokes.</p>
申请公布号 JP2001244175(A) 申请公布日期 2001.09.07
申请号 JP20000052515 申请日期 2000.02.28
申请人 NIKON CORP 发明人 YANAGIHARA MASAMITSU;GOTO EIJI;YOKOTA MUNEYASU
分类号 G03F1/00;G03F1/70;G03F7/20;H01L21/027;(IPC1-7):H01L21/027;G03F1/08 主分类号 G03F1/00
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