INTERFEROMETER AND SPECTRUM ANALYZER

摘要

PROBLEM TO BE SOLVED: To provide an interferometer and a spectrum analyzer capable of making a measuring beam branch into multiple measuring beams with retention of an amount of shift in wavelength of the measuring beam. SOLUTION: In the interferometer, an interference beam is generated by interfering with a beam from light source 2, and a sample 12 is irradiated with the interference beam as the measuring beam. The interferometer comprises a branching means 15 for branching the measuring beam into multiple beams.