| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC socket capable of executing an IC test easily in a short time. SOLUTION: In this IC socket with an upper lid, a suction device 4 having an operation knob 12, an air inlet/outlet member 14 having a capacity increasing or decreasing according to operation of the operation knob 12, and a suction cup 16 installed on the air inlet/outlet member 14 is installed on the upper lid 2.
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