发明名称 DENSE-PLASMA ETCHING OF INP-BASED MATERIALS USING CHLORINE AND NITROGEN
摘要 <p>A semiconductor dry etching process that provides deep, smooth, and vertical etching of InP-based materials using a chlorinated plasma with the addition of nitrogen (N2) gas. Etching of InP-based semiconductors using an appropriate C12/N2 mixture without any additional gases provides improved surface morphology, anisotropy and etch rates.</p>
申请公布号 WO2001065593(A1) 申请公布日期 2001.09.07
申请号 US2001006472 申请日期 2001.02.28
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