| 摘要 |
PROBLEM TO BE SOLVED: To provide a method for measuring deviation in a liquid crystal dis play panel and its measuring device, capable of highly accurately and quantita tively measuring deviation concomitant with superposition of transparent substrates with a TFT(thin-film transistor) and with a microlens attached thereto in the liquid crystal display panel or variation of stack thickness of the microlens. SOLUTION: A light source 30, the liquid crystal display panel 10 and a photoreceiving device 32 are arranged on a straight line. An inclined angle of the liquid crystal display panel 10 is varied with respect to parallel laser beams from the light source 30 with a hold control means. Thereby incident anglesθ1 andθ2 to the microlens 18 respectively corresponding to the first and second maxima of light intensity received with the light receiver 32 are measured. Highly accurate and quantitative measured values are obtained by calculating deviation concomitant with superpositionΔy of the microlens 18 and a pixel 12 and the variation of a stack thicknessΔd of the microlens, based on the data with an operational device 34.
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