| 摘要 |
PROBLEM TO BE SOLVED: To execute a test to be executed essentially, even if the same power supply voltage is supplied by using a common power supply pad to mutually connected circuits to which different power supply voltages are supplied originally, concerning a semiconductor device and its test method. SOLUTION: This semiconductor device having a normal mode and a test mode for executing a test is equipped with a first circuit for inputting an input signal, a test signal and an output enable signal, and outputting the input signal in response to the output enable signal, a second circuit connected to the first circuit, for outputting the input signal obtained from the first circuit, and the power supply pad for supplying the first circuit and the second circuit with a common power supply voltage. The device is constituted so that, when the test signal shows a test mode, the first circuit fixes output impedance of the second circuit at high impedance regardless of the output enable signal.
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