发明名称 |
GAS WASHING METHOD OF SEMICONDUCTOR SUBSTRATE SURFACE |
摘要 |
PROBLEM TO BE SOLVED: To prepare reliable semiconductor devices by a gas washing method of a semiconductor substrate surface by carrying out ozone exposure accompanying ultraviolet-ray irradiation under reduced pressure, and by effectively removing carbon impurities on the semiconductor substrate surface. SOLUTION: In the substrate pretreatment washing process when semiconductor devices are prepared, a substrate temperature is maintained from the room temperature to 1200 deg.C, and ultraviolet rays are applied onto the substrate surface for carrying out ozone exposure.
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申请公布号 |
JP2001244227(A) |
申请公布日期 |
2001.09.07 |
申请号 |
JP20000049757 |
申请日期 |
2000.02.25 |
申请人 |
NATL INST OF ADVANCED INDUSTRIAL SCIENCE & TECHNOLOGY METI |
发明人 |
KOSUGI RYOJI;ICHIMURA SHINGO;KUROKAWA AKIRA;FUKUDA KENJI;SENZAKI SUMIHISA;CHO GENSHU;OGUSHI HIDEYO;ARAI KAZUO |
分类号 |
C30B29/36;C30B33/12;H01L21/304;(IPC1-7):H01L21/304 |
主分类号 |
C30B29/36 |
代理机构 |
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