发明名称 GAS WASHING METHOD OF SEMICONDUCTOR SUBSTRATE SURFACE
摘要 PROBLEM TO BE SOLVED: To prepare reliable semiconductor devices by a gas washing method of a semiconductor substrate surface by carrying out ozone exposure accompanying ultraviolet-ray irradiation under reduced pressure, and by effectively removing carbon impurities on the semiconductor substrate surface. SOLUTION: In the substrate pretreatment washing process when semiconductor devices are prepared, a substrate temperature is maintained from the room temperature to 1200 deg.C, and ultraviolet rays are applied onto the substrate surface for carrying out ozone exposure.
申请公布号 JP2001244227(A) 申请公布日期 2001.09.07
申请号 JP20000049757 申请日期 2000.02.25
申请人 NATL INST OF ADVANCED INDUSTRIAL SCIENCE & TECHNOLOGY METI 发明人 KOSUGI RYOJI;ICHIMURA SHINGO;KUROKAWA AKIRA;FUKUDA KENJI;SENZAKI SUMIHISA;CHO GENSHU;OGUSHI HIDEYO;ARAI KAZUO
分类号 C30B29/36;C30B33/12;H01L21/304;(IPC1-7):H01L21/304 主分类号 C30B29/36
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