发明名称 AN IMPROVED HIGH DENSITY MEMORY CELL
摘要 <p>A memory cell comprising an inverting stage, an access transistor coupled between a data line and an input of the inverting stage, the access transistor being responsive to a control signal for selectively coupling the data line and the inverting stage input, a feedback transistor coupled to the inverting stage input and being responsive to an output of the inverting stage for latching the inerting stage in a first logic state and whereby the cell is maintained in a second logic state by a leakage current flowing through the access transistor which is greater than a current flowing through the feedback transistor.</p>
申请公布号 WO2001065565(A1) 申请公布日期 2001.09.07
申请号 CA2001000273 申请日期 2001.03.05
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