Integrated electronic module for influencing external functions

摘要

The module has an IC core (4) for performing logic operations, a boundary scan chain (3) for connecting the IC core with terminal pins (5) of the module (1*) and a boundary scan control unit (2) for controlling the chain (3) in order to test the IC core. The chain comprises a number of boundary scan cells (BSZ) which are individually connected to the IC core as well as to the terminal pins. At least one boundary scan auxiliary cell (BSHZ) is provided which is connected to a corresponding terminal pin (FB). The control unit (2) controls the auxiliary cell independently from the other boundary scan cells.