发明名称 Inductively coupled plasma CVD
摘要 A method of depositing a dielectric film on a substrate in a process chamber of an inductively coupled plasma-enhanced chemical vapor deposition reactor. Gap filling between electrically conductive lines on a semiconductor substrate and depositing a cap layer are achieved. Films having significantly improved physical characteristics including reduced film stress are produced by heating the substrate holder on which the substrate is positioned in the process chamber.
申请公布号 US2001019903(A1) 申请公布日期 2001.09.06
申请号 US20010775664 申请日期 2001.02.05
申请人 SHUFFLEBOTHAM PAUL KEVIN;MCMILLIN BRIAN;DEMOS ALEX;NGUYEN HUONG;BERNEY BUTCH;BEN-DOR MONIQUE 发明人 SHUFFLEBOTHAM PAUL KEVIN;MCMILLIN BRIAN;DEMOS ALEX;NGUYEN HUONG;BERNEY BUTCH;BEN-DOR MONIQUE
分类号 C23C16/40;C23C16/507;H01L21/316;H01L21/768;(IPC1-7):C23C16/00;H01L21/31 主分类号 C23C16/40
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