发明名称 |
Method of measuring reflection off multilayer dielectric coating |
摘要 |
<p>A method of measuring the absorption of a lens covered with multilayers of dielectric materials comprises directing a beam of polarized light against the dielectric materials, polarizing the diffused beam of reflected light, and measuring the energy in the polarized diffused beam of reflected light, which is representative of the reflective and absorptive properties of the multilayers of the dielectric materials. The diffused beam is polarized at an angle that is complementary to the angle of the linearly polarized light that is directed against the dielectric materials. The complementary angle serves to null the diffused beam of reflected light. <IMAGE></p> |
申请公布号 |
EP1130380(A2) |
申请公布日期 |
2001.09.05 |
申请号 |
EP20010102124 |
申请日期 |
2001.01.31 |
申请人 |
TRW INC. |
发明人 |
TAN, BENJAMIN;MCKAY, ANDY G.;MANDRE, TAARO |
分类号 |
G01M11/02;G01N21/55;G01N21/21;(IPC1-7):G01N21/21 |
主分类号 |
G01M11/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|