发明名称 Integrated memory having redundant units of memory cells, and test method for the redundant units
摘要 Each redundant unit of an integrated memory device is assigned respective programmable elements, comparison units, a code converting unit, a logic unit and a multiplexer. Each multiplexer has a first switching state, in which it connects outputs of the first comparison units to first inputs of the logic unit, and a second switching state, in which it connects outputs of the code converting unit to the first inputs of the logic unit. In the second switching state of the multiplexers, each redundant unit is assigned a different address in the unprogrammed state of the programmable elements. Therefore, redundant units can be selected individually for test purposes.
申请公布号 US6285605(B1) 申请公布日期 2001.09.04
申请号 US20000580982 申请日期 2000.05.30
申请人 INFINEON TECHNOLOGIES AG 发明人 SCHROEGMEIER PETER;DIETRICH STEFAN;SCHOENIGER SABINE;WEIS CHRISTIAN
分类号 G11C7/00;G11C29/00;G11C29/24;(IPC1-7):G11C7/00 主分类号 G11C7/00
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