发明名称 Method and apparatus for image adjustment
摘要 A method of variably exposing photosensitive material. A semiconductor wafer is provided. A first target region and a second target region are identified on the semiconductor wafer. Photosensitive material is provided on the semiconductor wafer. An illuminating system including a source of illumination is provided. A mask is provided between the source of illumination and the photosensitive material. The photosensitive material is illuminated through the mask with the illuminating system to provide in a single step of the illuminating system a first illumination dose to the first target region and a second illumination dose to the second target region. The first illumination dose differs from the second illumination dose. No further illumination dose is provided to equalize the first illumination dose and the second illumination dose.
申请公布号 US6284443(B1) 申请公布日期 2001.09.04
申请号 US19990302628 申请日期 1999.04.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ANDERSON BRENT A.;HIBBS MICHAEL S.;IYER SUBRAMIAN S.
分类号 G03F1/14;G03F7/20;(IPC1-7):G03C7/00 主分类号 G03F1/14
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