发明名称 |
Memory cell string structure of a flash memory device |
摘要 |
A nonvolatile semiconductor memory device includes a memory cell array divided into a plurality of memory blocks. A plurality of bit lines are arranged through the plurality of memory blocks, and a plurality of word lines are arranged in each of the memory blocks so as to intersect the bit lines. Each of the memory blocks includes a plurality of memory cell strings corresponding to the bit lines. Each memory cell string includes a first string segment having a plurality of EEPROM cells and a second string segment having a plurality of EEPROM cells. A first select transistor connects the first string segment to a corresponding bit line in response to a first select signal. A second select transistor connects the first string segment to the second string segment in response to a second select signal. And a third select transistor connects the second string segment to a common source line in response to a third select signal.
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申请公布号 |
US6285587(B1) |
申请公布日期 |
2001.09.04 |
申请号 |
US20000593259 |
申请日期 |
2000.06.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KWON SEOK-CHEON |
分类号 |
G11C16/04;G11C16/02;G11C16/24;(IPC1-7):G11C16/00 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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