发明名称 |
Semiconductor device having a fuse |
摘要 |
The present invention provides a fuse of a semiconductor device and a method of forming a fuse of a semiconductor device. The method of the invention includes forming an underlying metal conductor on a semiconductor substrate, forming an insulating film over the underlying metal conductor, and selectively etching regions of the insulating film. One of the regions of the insulating film is etched to form a via contact region exposing the underlying metal conductor. A second region is etched to form a groove in the insulating film for the fuse metal. Metal is buried within the second etched region of the insulating film and the via contact region to respectively form a fuse metal pattern and a via contact metal layer.
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申请公布号 |
US6285540(B1) |
申请公布日期 |
2001.09.04 |
申请号 |
US20000560359 |
申请日期 |
2000.04.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE DONG-HUN;AHN JONG-HYON |
分类号 |
H01L21/82;H01L23/525;(IPC1-7):H02H5/04 |
主分类号 |
H01L21/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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