发明名称 Time domain reflectometry apparatus and method
摘要 A reference length of electrically conductive material having a predetermined electrical length and impedance permanently inserted in a time domain reflectometer measuring path prior to the connection point to the cable-under-test. Measurement to the start of the reference length is used to establish a reference position within the measurement path for subsequent time domain reflectometry measurements.
申请公布号 US6285195(B1) 申请公布日期 2001.09.04
申请号 US19980039511 申请日期 1998.03.16
申请人 NEEDLE DAVID 发明人 NEEDLE DAVID
分类号 G01R31/11;(IPC1-7):G01K31/11 主分类号 G01R31/11
代理机构 代理人
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