发明名称 Semiconductor device containing a porous structure and method of manufacturing the same
摘要 A semiconductor device and a method of manufacturing the same are provided with a silicon region of a first conductivity type, a silicon layer including at least one cavity existing inside the silicon region as a buried layer, and a source/drain region of a second conductivity type different from the first conductivity type selectively formed directly on an upper surface of the silicon region with a bottom surface of the source/drain region located adjacent to an upper surface of the silicon layer such that a depletion layer between the silicon region and the bottom surface of the source/drain region exists inside the silicon layer. With such a structure, a semiconductor device achieves a faster operation and lower power consumption while ensuring stable operation as a MOSFET.
申请公布号 US6285072(B1) 申请公布日期 2001.09.04
申请号 US19990396358 申请日期 1999.09.15
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MAEDA SHIGENOBU
分类号 H01L29/78;H01L21/306;H01L21/334;H01L21/336;H01L21/762;H01L21/8234;H01L27/088;H01L29/10;H01L29/786;(IPC1-7):H01L29/06 主分类号 H01L29/78
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