发明名称 |
Semiconductor device containing a porous structure and method of manufacturing the same |
摘要 |
A semiconductor device and a method of manufacturing the same are provided with a silicon region of a first conductivity type, a silicon layer including at least one cavity existing inside the silicon region as a buried layer, and a source/drain region of a second conductivity type different from the first conductivity type selectively formed directly on an upper surface of the silicon region with a bottom surface of the source/drain region located adjacent to an upper surface of the silicon layer such that a depletion layer between the silicon region and the bottom surface of the source/drain region exists inside the silicon layer. With such a structure, a semiconductor device achieves a faster operation and lower power consumption while ensuring stable operation as a MOSFET.
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申请公布号 |
US6285072(B1) |
申请公布日期 |
2001.09.04 |
申请号 |
US19990396358 |
申请日期 |
1999.09.15 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
MAEDA SHIGENOBU |
分类号 |
H01L29/78;H01L21/306;H01L21/334;H01L21/336;H01L21/762;H01L21/8234;H01L27/088;H01L29/10;H01L29/786;(IPC1-7):H01L29/06 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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