发明名称 Method and system for testing rambus memory modules
摘要 A system and method for testing a RIMM loaded with RDRAM integrated circuits generates and reads test transaction data with a test transaction engine, such as a microprocessor-based memory tester. A RIMM adapter interfaces with the test transaction engine and the RIMM under test to communicate test data, including test write, address, control and read data. A comparison of test read data returned to the test transaction engine from the RIMM against predetermined values allows a determination of the operational status of the RIMM. The RIMM adapter is embodied as an ASIC with plural FIFO circuits interfaced between the test transaction engine and a channel controller and RAC. The FIFOs reconcile differences in timing between generation and return of test data and demands by the RAC and channel controller. Separate read and write data paths between the test transaction engine and ASIC support improved rates of data transfer. The test transaction engine provides full speed test transactions by using instruction data to generate test data with FPGAs.
申请公布号 US6285962(B1) 申请公布日期 2001.09.04
申请号 US19990267731 申请日期 1999.03.15
申请人 TANISYS TECHNOLOGY, INC. 发明人 HUNTER PAUL R.
分类号 G01R31/319;G01R31/3193;G11C29/56;(IPC1-7):G01R31/27 主分类号 G01R31/319
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