| 摘要 |
An apparatus for isolated thermal fault finding in an electronic component comprises; an infra-red (IR) radiation source; means for focussing the IR radiation source into an area on the upper exposed surface of the component under test; a thermal sensor for sensing the heat radiated from the component under test. The apparatus is useful in performing the inventive method for isolated thermal fault finding in an electronic component which comprises; i) focussing a beam of infra-red radiation onto a small area at about the centre of the electronic component; ii) monitoring the temperature of the component of step i) ; and iii) maintaining the temperature of the component of step i) at a predetermined maximum level dictated by the function and/or environmental in which the component is to be used. |
