发明名称 CIRCUIT BOARD INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a circuit board inspection device capable of detecting surely a short circuit between conductor patterns. SOLUTION: This circuit board inspection device 1 has a constitution in which a first inspection probe 3 capable of contacting with a circuit board P which is aninspection object, and a conductor pattern on the circuit board P and capacitance between the conductor pattern and a reference electrode is measured by using the first inspection probe 3, to thereby enable to discriminate the quality of the circuit board P based on the measured capacitance. In the device, a second inspection probe 4 is provided additionally, and the first inspection probe 3 and the second inspection probe 4 are brought into contact respectively with two mutually adjoining conductive patterns, to measure capacitance between both conductor patterns, and short circuit inspection relative to both conductor patterns is executed based on the measurement result.
申请公布号 JP2001235502(A) 申请公布日期 2001.08.31
申请号 JP20000045281 申请日期 2000.02.23
申请人 HIOKI EE CORP 发明人 MINAMI HIDEAKI
分类号 G01R1/06;G01R31/02;H05K3/00;(IPC1-7):G01R31/02 主分类号 G01R1/06
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