| 摘要 |
PROBLEM TO BE SOLVED: To reduce the cost by simplifying the structure of a device. SOLUTION: A reference plate 5 is placed near a measuring opening 3 where a measuring sample 4 is mutually opposingly placed, and a sample beam reflected on the sample 4 and a reference beam reflected on the reference plate 5 are introduced into a first incident slit and a second incident slit of a masking plate 24, respectively, by an optical means consisting of a plain reflecting mirror 21 and image forming lenses 22, 23. Each of the sample beam and the reference beam passing through the first incident slit and the second incident slit, respectively, is spectroscopically divided by a spectroscopical part 30, and each electrical signal corresponding to light intensity of divided beam is outputted by a detecting part 40 every wavelength. The spectroscopic reflection property of the sample 4 is calculated by a processing part 50 using each electrical signal.
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