发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT LAYOUT METHOD
摘要 PROBLEM TO BE SOLVED: To take a measure against an antenna effect simply in an automatic layout system for LSI layout design. SOLUTION: In an automatic layout routing method using cells constituting a semiconductor integrated circuit, a fill cell having a protection circuit for preventing electrification is disposed in a gap between the disposed cells. Such a protection circuit is constituted by diode elements. An antenna effect due to electrification of wiring is checked by using an EDA(electronic digital analyzer) tool, and wiring the requires a measure against the antenna effect is connected to the protection circuit in the fill cell. Furthermore, in a semiconductor integrated circuit layout method, when a fill cell is not disposed in the vicinity of the wiring that requires a measure against an antenna effect, a plurality of gaps generated between cells constituting the semiconductor integrated circuit are gathered in the vicinity of the wiring that required a protecting measure against an antenna effect.
申请公布号 JP2001237322(A) 申请公布日期 2001.08.31
申请号 JP20000049123 申请日期 2000.02.25
申请人 NEC MICROSYSTEMS LTD 发明人 MORIKAWA NOBUHITO
分类号 H01L27/04;G06F17/50;H01L21/82;H01L21/822;H01L23/522;H01L27/02;(IPC1-7):H01L21/82 主分类号 H01L27/04
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