发明名称 |
FINE STRUCTURE DEVICE AND METHOD OF MANUFACTURING THE SAME, AND HIGH DENSITY MAGNETIC STORAGE DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To eliminate the problem that, in a fine structure formation process, a hyperfine magnetic structure in a magnetic storage made tic having a density exceeding 100 Gbit/inch2 cannot be shrinked in size, while keeping the thickness sufficient for storage by a method wherein such processes as etching and liftoff are provided on an attached thin film. SOLUTION: A fine structure device 10 consists of an Si substrate 1 having projecting parts surrounded by a steep slope and fine structures 3 formed on the upper faces of the projecting parts. The Si substrate 1 has an unevenness on the surface. The projecting parts of the unevenness are surrounded by the steep slopes. The fine structures 3 are formed on the upper faces of the projecting part through a mask pattern 2. The mask pattern 2 is an oxide film pattern leaving the surface of the substrate as the projecting parts when forming the unevenness on the surface of the Si substrate 1 by, for example, as ECR chlorine plasma process.
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申请公布号 |
JP2001237385(A) |
申请公布日期 |
2001.08.31 |
申请号 |
JP20000046686 |
申请日期 |
2000.02.24 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT> |
发明人 |
NAGASE MASAO;YAMAZAKI KENJI;KURIHARA KENJI |
分类号 |
C23C14/34;G11B5/65;G11B5/73;G11B5/851;H01L21/203;H01L27/10;H01L43/08;(IPC1-7):H01L27/10 |
主分类号 |
C23C14/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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