发明名称 |
MICROSCOPE WITH ELECTRON BEAM FOR ILLUMINATION |
摘要 |
PURPOSE: A microscope with electron beam for illumination is provided to switch various magnifications or illuminating methods rapidly and simply when an electron microscope and an optical microscope are jointly used. CONSTITUTION: A general structure of the microscope(2) is substantially similar to that of conventional microscopes. The microscope(2) includes a support(4) with a stay(6) thereon. A support arm(8) is attached to or formed on the stay(6). Objective lenses(18) are placed on a revolver(20) and includes one or more objective lenses for the electron beam.
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申请公布号 |
KR20010082645(A) |
申请公布日期 |
2001.08.30 |
申请号 |
KR20010007448 |
申请日期 |
2001.02.15 |
申请人 |
LEICA MICROSYSTEMS WETZLAR GMBH |
发明人 |
HOHN FRITZ JUERGEN |
分类号 |
H01J37/22;H01J37/16;H01J37/18;H01J37/28;(IPC1-7):G02B21/02 |
主分类号 |
H01J37/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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