发明名称 MICROSCOPE WITH ELECTRON BEAM FOR ILLUMINATION
摘要 PURPOSE: A microscope with electron beam for illumination is provided to switch various magnifications or illuminating methods rapidly and simply when an electron microscope and an optical microscope are jointly used. CONSTITUTION: A general structure of the microscope(2) is substantially similar to that of conventional microscopes. The microscope(2) includes a support(4) with a stay(6) thereon. A support arm(8) is attached to or formed on the stay(6). Objective lenses(18) are placed on a revolver(20) and includes one or more objective lenses for the electron beam.
申请公布号 KR20010082645(A) 申请公布日期 2001.08.30
申请号 KR20010007448 申请日期 2001.02.15
申请人 LEICA MICROSYSTEMS WETZLAR GMBH 发明人 HOHN FRITZ JUERGEN
分类号 H01J37/22;H01J37/16;H01J37/18;H01J37/28;(IPC1-7):G02B21/02 主分类号 H01J37/22
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