| 摘要 |
A semiconductor memory device includes bit lines which transfer data of memory cells, a plurality of first sense amplifier circuits connected to odd-number lines of the bit lines, a plurality of second sense amplifier circuits connected to even-number lines of the bit lines, and a clamp-voltage generation circuit which supplies a first clamp voltage to the first sense amplifier circuits, and supplies a second clamp voltage to the second sense amplifier circuits, whereby during test operation, the odd-number lines are clamped to the first clamp voltage, and the even-number lines are clamped to the second clamp voltage.
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