发明名称 SEMICONDUCTOR DEVICE WITH A CONDDUCTIVE METAL LAYER ENGAGING NOT LESS THAN FIFTY PERCENT OF A SOURCE/DRAIN REGION
摘要 A semiconductor device includes a transistor element having a gate electrode, a source.drain region and a channel region, a first interlayer insulator formed on the transistor element, a second interlayer insulator formed on the first interlayer insulator, an interconnecting line formed on the second interlayer insulator, a conductive material filling layer formed by burying a conductive material in a first hole which is formed in the first interlayer insulator on the source.drain region, and a contact plug formed in a second hole which is formed in the second interlayer insulator. This semiconductor device has a low sheet resistance, can perform high-speed operation and increase the degree of integration, has high reliability, and does not largely increase the number of fabrication steps. A method of fabricating the semiconductor device is also provided.
申请公布号 US2001017417(A1) 申请公布日期 2001.08.30
申请号 US19980052564 申请日期 1998.03.31
申请人 KURODA HIDEAKI 发明人 KURODA HIDEAKI
分类号 H01L21/28;H01L21/285;H01L21/336;H01L21/60;H01L21/768;H01L21/8242;H01L23/485;H01L23/522;H01L27/108;H01L29/78;(IPC1-7):H01L23/48;H01L23/52;H01L29/40 主分类号 H01L21/28
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