发明名称 MODULE TEST HANDLER
摘要 PURPOSE: A module test handler is provided to improve the productivity by testing and classifying automatically modules supplied to a return tray. CONSTITUTION: A module supply portion(100) has two or more supply stations(120) for loading a return tray(1) carrying test modules. The first and the second test portions(130') tests the modules provided from the module supply portion(100). A tray supply portion(160) loads a user tray(2) to a carrying stacker when tested modules are filled in the user tray(2) loaded on a module loading location. A user tray stacker loads a multitude of empty user tray(2). The first and the second inferior module loading trays(3,3') and the first retest module loading jig and the second retest module loading jig(190') load inferior modules and retest modules according to the test result. The first and the second movable buffers(140,140') are installed between the first test portion and the second test portion(130'). The first movable robot(51) moves the modules among the first test portion(130'), the supply station(120), the movable buffer(140), the first inferior module loading tray(3), and the first retest module loading jig.(190) The second movable robot(52) moves the modules among the second test portion(130'), the module loading location, the movable buffer(140), the second inferior module loading tray(3'), and the second retest module loading jig(190').
申请公布号 KR20010081820(A) 申请公布日期 2001.08.29
申请号 KR20000007976 申请日期 2000.02.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUN, IN GU;LEE, JUN HO;PARK, HYU RIM
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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