发明名称 FIELD-EFFECT SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF
摘要 <p>A buried gate region, a buried gate contact region and a gate contact region are provided on an SiC substrate. Thereby, a depletion layer expands in the channel region, and a high withstand voltage is attained in the normally off state. By applying a voltage of the built-in voltage or less to a gate, the depletion layer in the channel region becomes narrower and an ON-state resistance becomes low. Furthermore, when a voltage of the built-in voltage or more is applied to the gate, holes are injected from the gate so as to cause the conductivity modulation, and the ON-state resistance becomes further low. <IMAGE></p>
申请公布号 EP1128443(A1) 申请公布日期 2001.08.29
申请号 EP19990970509 申请日期 1999.10.07
申请人 THE KANSAI ELECTRIC POWER CO., INC. 发明人 SUGAWARA, YOSHITAKA;ASANO, KATSUNORI
分类号 H01L29/808;H01L21/04;H01L21/329;H01L21/331;H01L21/332;H01L29/10;H01L29/24;H01L29/739;H01L29/744;H01L29/749;H01L29/772;H01L29/78;(IPC1-7):H01L29/80;H01L29/74 主分类号 H01L29/808
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