发明名称 |
FIELD-EFFECT SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF |
摘要 |
<p>A buried gate region, a buried gate contact region and a gate contact region are provided on an SiC substrate. Thereby, a depletion layer expands in the channel region, and a high withstand voltage is attained in the normally off state. By applying a voltage of the built-in voltage or less to a gate, the depletion layer in the channel region becomes narrower and an ON-state resistance becomes low. Furthermore, when a voltage of the built-in voltage or more is applied to the gate, holes are injected from the gate so as to cause the conductivity modulation, and the ON-state resistance becomes further low. <IMAGE></p> |
申请公布号 |
EP1128443(A1) |
申请公布日期 |
2001.08.29 |
申请号 |
EP19990970509 |
申请日期 |
1999.10.07 |
申请人 |
THE KANSAI ELECTRIC POWER CO., INC. |
发明人 |
SUGAWARA, YOSHITAKA;ASANO, KATSUNORI |
分类号 |
H01L29/808;H01L21/04;H01L21/329;H01L21/331;H01L21/332;H01L29/10;H01L29/24;H01L29/739;H01L29/744;H01L29/749;H01L29/772;H01L29/78;(IPC1-7):H01L29/80;H01L29/74 |
主分类号 |
H01L29/808 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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