发明名称 RESIST PEELING APPARATUS AND RESIST PEELING LIQUID MANAGEMENT METHOD, AND SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME SEMICONDUCTOR
摘要 PURPOSE: To maintain the element ratio of a resist peeling liquid to the adequate range for a long period of time in the resist for peeling resist residues adhered to a semiconductor wafer using a resist peeling liquid consisting of multiple elements. CONSTITUTION: A peeling liquid tank 14 is provided to store the resist peeling liquid. A conductivity monitor 46 is provided to monitor the conductivity of the resist peeling liquid. An additional element tank 50 is also provided to estimate the element ratio of the resist peeling liquid based on such conductivity, and adds the adequate amount of resist peeling liquid based on the estimation result to cover the shortage of such resist peeling liquid.
申请公布号 KR20010081948(A) 申请公布日期 2001.08.29
申请号 KR20000062576 申请日期 2000.10.24
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 HORI YOSHIYUKI;MURANAKA SEIJI;TANAKA HIROSHI
分类号 G03F7/30;G03F7/42;H01L21/00;H01L21/027;H01L21/304;H01L21/306;H01L21/311;(IPC1-7):H01L21/027 主分类号 G03F7/30
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