发明名称 BAKER UNIT OF PHOTO-LITHOGRAPHY SYSTEM
摘要 PURPOSE: A baker unit of a photo-lithography system is provided to sense a state of a wafer by installing a sensor at a plate oven. CONSTITUTION: A chamber(50) is prepared to form an airtight space. A panel(51) is installed at an outer side of the chamber(50). A plate oven is installed an inside of the chamber(50). A heating source for heating a wafer(70) is formed at an inside of the plate oven(60). A projection face(61) is formed on an upper face of the plate oven(60). The wafer(70) is loaded on the projection face(61). A multitude of guide(63) is prepared to prevent escape of the wafer(70). A sensor(67) is formed on the projection face(61) to sense a state of the loaded wafer(70).
申请公布号 KR20010081743(A) 申请公布日期 2001.08.29
申请号 KR20000007843 申请日期 2000.02.18
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, GYU SEUNG
分类号 H01L21/027;(IPC1-7):H01L21/027 主分类号 H01L21/027
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