发明名称 Scan structure for CMOS storage elements
摘要 <p>Scan chain links (306-310) which step data through a scan chain (306-310) using only a single control signal, and which require a reduced number of transistors to scan data into and out of a latch (300-304). One scan chain link (308), which allows the output of a scanned latch (302) to "wiggle", uses eight transistors and only a single control signal (SHIFT). Another scan chain link (308), which prevents the output of a scanned latch (302) from "wiggling", and which allows data to be maintained in the latch during a scan operation if it is so desired, uses twenty-five transistors and two control signals: one control signal (SHIFT) for stepping data through a scan chain, and an additional control signal (SCANNING) for preventing the output of a scanned latch from wiggling. &lt;IMAGE&gt;</p>
申请公布号 EP1128390(A1) 申请公布日期 2001.08.29
申请号 EP20000118883 申请日期 2000.08.31
申请人 HEWLETT-PACKARD COMPANY 发明人 NAFFZIGER, SAMUEL D.
分类号 G06F11/22;G01R31/28;G01R31/3185;G11C19/00;G11C19/28;H03K3/037;(IPC1-7):G11C19/00 主分类号 G06F11/22
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