发明名称 Device and method for measuring deformation of a mechanical test specimen
摘要 A device for measuring the deformation of a mechanical test specimen, and including a pressing member (3) for stressing a substantially flat specimen (16) in controlled manner by means of a punch (25); a Michelson interferometer having an optical branch (9d) defined optically by a first face (16b) of the specimen (16), and for generating interference images related to the deformation of the specimen (16); a telecamera (44) for acquiring and digitizing the interference images; and a processor (27) for processing the digitized images and controlling the measuring process fully automatically. The interferometer (9) may alternatively perform white light interferometry measurements, ESPI measurements, or ESPI profilometry measurements, by simply substituting the light source and control software.
申请公布号 US6279404(B1) 申请公布日期 2001.08.28
申请号 US20000463263 申请日期 2000.04.14
申请人 EUROPEAN ATOMIC ENERGY COMMUNITY (EUROTOM) 发明人 WHELAN MAURICE;LUCIA ALFREDO C.
分类号 G01B9/02;G01B11/16;G01N3/02;G01N3/04;G01N3/06;G01N3/28;(IPC1-7):G01L1/24 主分类号 G01B9/02
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