发明名称 Technique to obtain increased channel mobilities in NMOS transistors by gate electrode engineering
摘要 A method of modifying the mobility of a transistor. First, a transistor having a gate is formed. A substance is then implanted in the gate. The transistor is annealed such that the implanted substance forms at least one void in the transistor's gate.
申请公布号 US6281532(B1) 申请公布日期 2001.08.28
申请号 US19990340954 申请日期 1999.06.28
申请人 INTEL CORPORATION 发明人 DOYLE BRIAN S.;ROBERDS BRIAN;LEE JIN
分类号 H01L21/265;H01L21/28;H01L29/06;(IPC1-7):H01L29/76 主分类号 H01L21/265
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