发明名称 |
Interposer for maintaining temporary contact between a substrate and a test bed |
摘要 |
Disclosed is an interposer and test structure for making contact between a substrate and a test bed. One embodiment of the interposer has a floating, rigid conductive element in a nonconductive body which makes temporary contact between the test bed and the substrate. In another embodiment of the invention, the interposer includes two layers of material, in which one layer includes pogo pins for contacting the substrate and the other layer includes pads for contacting the test bed. The pogo pins are on a grid spacing corresponding to that of the substrate input/output pads while the interposer pads are on a grid spacing corresponding to that of the pogo pin contactors of the test bed.
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申请公布号 |
US6281692(B1) |
申请公布日期 |
2001.08.28 |
申请号 |
US19980166468 |
申请日期 |
1998.10.05 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BODENWEBER PAUL F.;COMULADA RALPH R.;FAROOQ MUKTA S.;HENDRICKS CHARLES J.;HODGE PHILO B.;PETERSON VINCENT P.;SPOOR TERENCE W.;WILEY KATHLEEN M.;YU YUET-YING |
分类号 |
G01R1/073;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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