发明名称 Semiconductor dynamic quantity-sensor and method of manufacturing the same
摘要 A method and apparatus for manufacturing a semiconductor physical quantity sensor according to the present invention achieves the high sensing accuracy and reliability and prevents a sticking phenomenon. Specifically, a semiconductor physical quantity sensor is cleaned by a displacement liquid and is dried while a SOI substrate is revolving. The number of revolutions is determined so that a suction force (Fs), which acts on a silicon substrate by a surface tension of the displacement liquid, a sensor spring force FK and a centrifugal force (Fr) generated by the acceleration in the revolution can satisfy the following condition: (FK+Fr)>FS. In order to prevent the sticking phenomenon after the stop of the spray, the semiconductor physical quantity sensor is dried by spraying an inert gas such as nitrogen including minus ions so that the revolving SOI substrate can eliminate static electricity generated by friction of the air flow.
申请公布号 US6281033(B1) 申请公布日期 2001.08.28
申请号 US19990471712 申请日期 1999.12.23
申请人 FUJI ELECTRIC CO., LTD. 发明人 UAYANAGI KATSUMICHI;SASAKI MITSUO;NISHIKAWA MUTSUO;KATSUMI SHIHO
分类号 G01L9/04;G01L9/00;G01P15/08;G01P15/12;H01L29/84;(IPC1-7):H01L21/00;H01L21/302;C23F1/00 主分类号 G01L9/04
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