发明名称 CHEMICAL MECHANICAL POLISHING SYSTEM
摘要 PROBLEM TO BE SOLVED: To provide a method and a device for conditioning a polishing pad. SOLUTION: This chemical mechanical polishing system is a semiconductor wafer treatment system, in particular, to say in more detail, a polishing medium reconditioning system. In one embodiment, the polishing medium reconditioning system is provided with at least a first conditioning roller and a second conditioning roller in contact with a work surface of a polishing medium while it rotates in the opposing direction. In the other embodiment, it includes a conditioning plate arranged on a carrier including a polishing head, a conditioning roller or a disc crossing a surface of the polishing medium, and a conditioning disc conditioning the polishing medium while it is held in the polishing head. Instead the polishing medium can be conditioned using a device performing conditioning apart from the treatment system.
申请公布号 JP2001232547(A) 申请公布日期 2001.08.28
申请号 JP20000383969 申请日期 2000.12.18
申请人 APPLIED MATERIALS INC 发明人 SOMMER PHILIP R;BUTTERFIELD PAUL D;BIRANG MANOOCHER
分类号 B24B53/00;B24B21/04;B24B21/18;B24B37/26;B24B37/30;B24B53/007;B24B53/017;B24B53/12;B24B57/02;H01L21/304 主分类号 B24B53/00
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