发明名称 Wafer handling device having conforming perimeter seal
摘要 A vacuum-assisted chuck assembly for coupling to a warped semiconductor wafer is provided. In one embodiment, the assembly comprises a wafer chuck and a conforming perimeter seal. The seal permits effective vacuum coupling of the chuck to the warped wafer without operator intervention. As vacuum pressure is applied, the seal prevents leakage around the warped wafer, allowing the vacuum pressure to deflect the wafer until the wafer contacts and seals against an engaging surface located on the chuck. By utilizing the seal, the chuck assembly may operate at a reduced vacuum pressure as compared to conventional wafer chucks. Furthermore, by providing an effective vacuum seal to the warped wafer surface, manual operator intervention during vacuum coupling is reduced or eliminated.
申请公布号 US6279976(B1) 申请公布日期 2001.08.28
申请号 US19990311032 申请日期 1999.05.13
申请人 MICRON TECHNOLOGY, INC. 发明人 BALL MICHAEL B.
分类号 B65G47/91;H01L21/683;(IPC1-7):B25J15/06 主分类号 B65G47/91
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