发明名称 Resist developing method by magnetic field controlling, resist developing apparatus and method of fabricating semiconductor device
摘要 A semiconductor device is fabricated by the steps of coating an underlayer formed on a semiconductor substrate with chemically amplified resist, exposing the resist to light, bringing the resist into contact with an alkaline developing solution with applying a magnetic field to the alkaline developing solution for conducting development to form a resist pattern, and etching the underlayer on the semiconductor substrate using the resist pattern as a mask.
申请公布号 US6279502(B1) 申请公布日期 2001.08.28
申请号 US19980182631 申请日期 1998.10.30
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 AZUMA TSUKASA
分类号 B05C11/08;B05D1/32;G03F7/30;H01L21/027;(IPC1-7):B05C11/02;B01J19/12;C25D13/06 主分类号 B05C11/08
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