| 发明名称 |
Monitor method for testing probe pins |
| 摘要 |
A monitor method for testing probe pins is described in this invention. In accordance with the method of the present invention, a particular probe pin with short, deformity or unstable contact is identified.
|
| 申请公布号 |
US6281694(B1) |
申请公布日期 |
2001.08.28 |
| 申请号 |
US19990449662 |
申请日期 |
1999.11.30 |
| 申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
TSAI MENG-JIN |
| 分类号 |
G01R1/073;G01R35/00;(IPC1-7):G01R31/02 |
主分类号 |
G01R1/073 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
