| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a sizing ultrasonic flaw detector improved in detectability of diffracted wave in TOFD process by use of an electronic scan probe. SOLUTION: The electronic scan probe is used to freely change the angle and focus of ultrasonic beam, thereby, making an ultrasonic wave able to hit on a defect with an optimum angle and intensity to perform the flaw detection by the TOFD process. Accordingly, the defect detectability can be improved, and a proper diffracted wave can be used to improve the sizing precision.</p> |
