发明名称 EVALUATION METHOD AND DEVICE FOR ELECTRON EMISSION ELEMENT AND MANUFACTURING METHOD AND DEVICE THEREFOR
摘要 <p>PROBLEM TO BE SOLVED: To provide an evaluation method and device for an electron emission element and a manufacturing method and device therefor capable of analyzing in a high precision and sensitivity the structure and condition of carbon or carbon compounds acquired from the sedimentary film in the activation process to aim at realizing a high-quality electron emission element and of reflecting the analytical results to the formation of the sedimentary film. SOLUTION: The vacuum treatment device has functions of not only an electron emission element manufacturing device (on and after the forming process), an electric characteristic measuring and evaluation device but also an evaluation device for the carbon or carbon compounds accumulated in the activation process.</p>
申请公布号 JP2001229829(A) 申请公布日期 2001.08.24
申请号 JP20000043578 申请日期 2000.02.16
申请人 CANON INC 发明人 HASHIMOTO HIROYUKI;SHIBATA MASAAKI
分类号 H01J9/42;H01J9/02;(IPC1-7):H01J9/42 主分类号 H01J9/42
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