发明名称 MEASURING DEVICE FOR PHYSICAL PROPERTY OF SAMPLE
摘要 <p>PROBLEM TO BE SOLVED: To provide a measuring device for physical property of sample by optically detecting the response from a sample to the irradiation with an ultra short optical pulse. SOLUTION: A Sagnac type common path optical interferometer capable of measuring physical properties at a vertical incident angle is constituted. This interferometer consists of a 2-arm Sagnac type interferometer, which uses three beam splitters. In measurement, the sample 14 is excited with the ultra short optical pulse, and the changes in intensity and phase of the optical beam caused at that time are detected. Accordingly, physical properties such as thickness, acoustic velocity, thermal property and the like of a substance can be extensively measured.</p>
申请公布号 JP2001228121(A) 申请公布日期 2001.08.24
申请号 JP20000038980 申请日期 2000.02.17
申请人 JAPAN SCIENCE & TECHNOLOGY CORP 发明人 OLIVA WRIGHT;DAVID HARLEY;MATSUDA OSAMU
分类号 G01B9/02;G01B11/02;G01B11/06;G01N21/17;G01N21/45;G01N25/16;G01N29/00;(IPC1-7):G01N29/00 主分类号 G01B9/02
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